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Method for X-ray diffractometry analysis at differing wavelengths without exchanging the X-ray source
Method for X-ray diffractometry analysis at differing wavelengths without exchanging the X-ray source
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机译:在不更换X射线源的情况下在不同波长下进行X射线衍射分析的方法
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摘要
A method for performing an X-ray diffractometry analysis of a crystalline and/or amorphous sample, by means of an optical X-ray apparatus having an X-ray source with an X-ray anode constructed from a mixed configuration of at least two metals is characterized in that an energy-dispersive semi-conductor is used for acquiring detector events from the X-rays emanating from the sample, and that X-rays diffracted or scattered by the sample with different characteristic energy lines belonging to the metals of the mixed configuration of the X-ray anode used, are acquired simultaneously during an angle scan. With this method, X-ray diffractometry analysis with multiple characteristic energy lines are possible without any need for conversion or switchover.
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