首页> 外国专利> Parking structure memory-module tester that moves test motherboards along a highway for remote loading/unloading

Parking structure memory-module tester that moves test motherboards along a highway for remote loading/unloading

机译:停车结构内存模块测试仪,可沿高速公路移动测试母板以进行远程装卸

摘要

A parking-structure test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. An unloader removes tested memory modules from test sockets on the motherboards, and a loader inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader to a parking and testing structure. An elevator raises or lowers the motherboards to different parking levels in the parking and testing structure. The motherboards move from the elevator to test stations on the parking level. A retractable connector from the test station makes contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns via the elevator and conveyors.
机译:停车结构测试系统具有测试内存模块的主板。母板不是固定的,而是放置在沿着传送带移动的可移动托盘内。卸载程序从主板上的测试插槽中卸下经过测试的内存模块,然后装载程序使用机械手将未经测试的内存模块插入主板。传送带将主板从装载机运送到停车和测试结构。电梯在停放和测试结构中将主板升高或降低到不同的停放高度。主板从电梯移动到停车场的测试站。测试站的可伸缩连接器与母板连接器接触,为母板加电,然后母板对内存模块进行测试。测试结果从测试站传送到主机控制器,当主板通过升降机和传送带返回时,主机控制器指示装卸机对已测试的内存模块进行分类。

著录项

  • 公开/公告号US8581614B2

    专利类型

  • 公开/公告日2013-11-12

    原文格式PDF

  • 申请/专利权人 RAMON S. CO;KEVIN J. SUN;

    申请/专利号US201113210284

  • 发明设计人 KEVIN J. SUN;RAMON S. CO;

    申请日2011-08-15

  • 分类号G01R31/20;

  • 国家 US

  • 入库时间 2022-08-21 16:01:59

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