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Memory circuit properly workable under low working voltage

机译:低工作电压下可正常工作的存储电路

摘要

A memory circuit properly workable under low working voltage includes a plurality of write word lines, a plurality of write bit lines, a plurality of read/write word lines, a plurality of read/write bit lines, a plurality of read/write inverted word lines, a plurality of virtual voltage source circuits, a plurality of virtual ground circuits, and a plurality of asymmetrical RAM cells constituting a cell array. The asymmetrical RAM cells are formed of seven transistors, five of which are NMOS transistors and two of which are PMOS transistors. The virtual voltage power source circuit and the virtual ground circuit can reinforce the write-in and read abilities under low working voltage to make the write-in and read actions more stable, decrease leakage current, and lower power consumption.
机译:可在低工作电压下正常工作的存储电路包括多条写字线,多条写位线,多条读/写字线,多条读/写位线,多条读/写反转字线,多个虚拟电压源电路,多个虚拟接地电路和构成单元阵列的多个非对称RAM单元。非对称RAM单元由七个晶体管形成,其中五个是NMOS晶体管,而两个是PMOS晶体管。虚拟电压电源电路和虚拟接地电路可以增强低工作电压下的写入和读取能力,以使写入和读取动作更稳定,减少漏电流并降低功耗。

著录项

  • 公开/公告号US8743592B2

    专利类型

  • 公开/公告日2014-06-03

    原文格式PDF

  • 申请/专利权人 JINN-SHYAN WANG;PEI-YAO CHANG;

    申请/专利号US201213477437

  • 发明设计人 PEI-YAO CHANG;JINN-SHYAN WANG;

    申请日2012-05-22

  • 分类号G11C11/412;

  • 国家 US

  • 入库时间 2022-08-21 16:01:10

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