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Semiconductor device and method of forming thick encapsulant for stiffness with recesses for stress relief in Fo-WLCSP

机译:在Fo-WLCSP中形成具有刚性的厚密封剂的半导体器件和方法,该密封剂具有用于缓解应力的凹部

摘要

A semiconductor device has a semiconductor die mounted to a carrier. A first encapsulant is deposited over the semiconductor die and carrier. A stiffening support member can be disposed over the carrier around the semiconductor die. A plurality of channels or recesses is formed in the first encapsulant. The recesses can be formed by removing a portion of the first encapsulant. Alternatively, the recesses are formed in a chase mold having a plurality of extended surfaces. A second encapsulant can be deposited into the recesses of the first encapsulant. The carrier is removed and an interconnect structure is formed over the semiconductor die and first encapsulant. The thickness of the first encapsulant provides sufficient stiffness to reduce warpage while the recesses provide stress relief during formation of the interconnect structure. A portion of the first encapsulant and recesses are removed to reduce thickness of the semiconductor device.
机译:半导体器件具有安装在载体上的半导体管芯。第一密封剂沉积在半导体管芯和载体上方。可以将加强支撑构件设置在围绕半导体管芯的载体上方。在第一密封剂中形成多个通道或凹槽。可以通过去除第一密封剂的一部分来形成凹槽。可替代地,在具有多个延伸表面的追模中形成凹槽。可以将第二密封剂沉积到第一密封剂的凹槽中。去除载体,并且在半导体管芯和第一密封剂上方形成互连结构。第一密封剂的厚度提供了足够的刚度以减少翘曲,而凹部在互连结构的形成期间提供了应力释放。去除第一密封剂的一部分和凹陷以减小半导体器件的厚度。

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