首页> 外国专利> Matching method for two-dimensional pattern, feature extracting method, apparatus used for the methods, and programs

Matching method for two-dimensional pattern, feature extracting method, apparatus used for the methods, and programs

机译:二维图案的匹配方法,特征提取方法,用于该方法的装置和程序

摘要

A 2-dimensional pattern matching method contains a process of extracting a query feature data by projecting a vector representation of either of a query 2-dimensional pattern and a transformed query 2-dimensional pattern which is generated by transforming the query 2-dimensional pattern, to a feature space. An enrollment feature data as previously enrolled and a query feature data are inversely projected to the 2-dimensional pattern representation space which has the dimension of the vector representation and the similarity is calculated. The data size of a feature amount is small and a matching technique robust to the positional displacement and the image distortion is provided.
机译:二维模式匹配方法包含通过投影查询二维模式和通过转换查询二维模式生成的转换后的查询二维模式的矢量表示来提取查询特征数据的过程,到特征空间。将先前已注册的注册特征数据和查询特征数据反向投影到具有矢量表示维的二维模式表示空间,并计算相似度。特征量的数据大小较小,并且提供了对位置位移和图像失真鲁棒的匹配技术。

著录项

  • 公开/公告号US8606019B2

    专利类型

  • 公开/公告日2013-12-10

    原文格式PDF

  • 申请/专利权人 TOSHIO KAMEI;

    申请/专利号US20080597119

  • 发明设计人 TOSHIO KAMEI;

    申请日2008-04-21

  • 分类号G06K9/46;

  • 国家 US

  • 入库时间 2022-08-21 15:58:56

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