首页> 外国专利> DEVICE FOR EVALUATING VISIBILITY OF TRANSPARENT SUBSTRATE, DEVICE FOR POSITIONING LAMINATE, DETERMINATION DEVICE, POSITION DETECTION DEVICE, DEVICE FOR EVALUATING SURFACE STATE OF METAL FOIL, PROGRAM, RECORDING MEDIUM, METHOD FOR MANUFACTURING PRINTED WIRING BOARD, METHOD FOR EVALUATING VISIBILITY OF TRANSPARENT SUBSTRATE, METHOD FOR POSITIONING LAMINATE, DETERMINATION METHOD, AND POSITION DETECTION METHOD

DEVICE FOR EVALUATING VISIBILITY OF TRANSPARENT SUBSTRATE, DEVICE FOR POSITIONING LAMINATE, DETERMINATION DEVICE, POSITION DETECTION DEVICE, DEVICE FOR EVALUATING SURFACE STATE OF METAL FOIL, PROGRAM, RECORDING MEDIUM, METHOD FOR MANUFACTURING PRINTED WIRING BOARD, METHOD FOR EVALUATING VISIBILITY OF TRANSPARENT SUBSTRATE, METHOD FOR POSITIONING LAMINATE, DETERMINATION METHOD, AND POSITION DETECTION METHOD

机译:用于评估透明基材可见性的设备,用于定位叠层的设备,确定设备,位置检测设备,用于评估金属箔的表面状态的设备,程序,记录介质,制造方法,用于印刷的布线的方法用于定位叠层的方法,确定方法和位置确定方法

摘要

Through the present invention, the visibility of a transparent substrate is efficiently and precisely evaluated. The device of the present invention for evaluating the visibility of a transparent substrate is provided with: an image taking means for taking an image, through a transparent substrate, of a mark which is present under the transparent substrate; an observation point/brightness graph creating means for measuring, for an image obtained by the image taking, the brightness of each observation point along a direction intersecting the direction in which the observed mark extends, and creating an observation point/brightness graph; and a visibility evaluation means for evaluating the visibility of the transparent substrate on the basis of the slope of a brightness curve occurring from an end part of the mark to a portion in which the mark is not present in the observation point/brightness graph.
机译:通过本发明,可以有效且准确地评价透明基板的可视性。本发明的用于评价透明基板的可视性的装置具有:摄像装置,其通过透明基板对存在于透明基板的下方的标记进行摄像。观察点/亮度图创建装置,用于对于通过图像拍摄获得的图像,沿着与观察标记的延伸方向相交的方向测量每个观察点的亮度,并创建观察点/亮度图;可见性评估装置,用于基于从标记的端部到观察点/亮度图中不存在标记的部分的亮度曲线的斜率来评估透明基板的可见性。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号