首页> 外国专利> Trace element X-ray fluorescence analyser using dual focusing X-ray monochromators

Trace element X-ray fluorescence analyser using dual focusing X-ray monochromators

机译:使用双聚焦X射线单色仪的微量元素X射线荧光分析仪

摘要

#$%^&*AU2013211492A120140220.pdf#####ABSTRACT An X-ray fluorescence analyser is provided which comprises: (1) an X-ray source selected to produce an intense X-ray beam, (2) a first optical element that focuses the X-ray beam produced by the X-ray source onto a sample and selects X-rays of a desired energy, (3) an energy resolving detector, and (4) a second optical element that receives fluorescent X-rays emitted from elements in the sample and focuses a selected energy range of said fluorescent X-rays onto said energy resolving detector. Each of the first and second optical elements includes a crystal component. The X-ray fluorescence analyser is configured such that: (i) the X-ray source has a spot size dimensioned so that it is substantially in a field of view of the first optical element, and (ii) the first optical element focuses the X-ray beam emitted by the X-ray source onto an area of the sample that corresponds to a field-of-view of the second optical element. Furthermore, the field of view for an optical element is defined as the area in the source plane of the respective crystal component over which X-rays are able to be emitted and still efficiently be reflected by said optical element.1/9 oc C) C~U-
机译:#$%^&* AU2013211492A120140220.pdf #####抽象提供了一种X射线荧光分析仪,其包括:(1)X射线源选择产生强烈的X射线束,(2)聚焦X射线源在样本上产生的X射线束,并选择所需的X射线能量,(3)能量分辨检测器和(4)接收第二光学元件从样品中的元素发出的荧光X射线聚焦选定的能量范围的所述荧光X射线照射到所述能量分辨检测器上。每个第一第二光学元件包括晶体成分。 X射线荧光分析仪配置为:(i)X射线源的光斑尺寸设计为它基本上是在第一光学元件的视场中,并且(ii)光学元件将X射线源发出的X射线光束聚焦到与第二光学元件的视野相对应的样本。此外,光学元件的视场定义为光源的源平面中的区域相应的晶体成分,在该晶体成分上可以发出X射线并保持静止所述光学元件有效地反射。1/9OCC)C〜U-

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