Provided are a cell culturing device and a system for prompting, on the basis of measurement results from a measurement means in which non-invasive measurement means have been combined, measurement by subsequent measurement means to execute quality inspections non-invasively. That is, impedance is monitored over time during culturing, the impedance measurement results are compared with a specified first threshold value, and depending on whether the measurement result is at or above the first threshold value or is less than the threshold value, subsequent inspection details are modified according to the presence or absence of changes in impedance.
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