首页> 外国专利> QUAD SMALL FORM-FACTOR PLUGGABLE LOOPBACK DEVICE FOR TEST

QUAD SMALL FORM-FACTOR PLUGGABLE LOOPBACK DEVICE FOR TEST

机译:四倍小型可插拔环回测试装置

摘要

Disclosed is a QSFP loopback device for test. The loopback device comprises: an electrical interface and a signal drive unit. The electrical interface is connected to a device under test and receives an electric signal, i.e. a test signal, from the device under test, the signal drive unit performs shaping and amplification processing on the test signal received by the electrical interface to obtain a loopback signal of the electric signal, and the electrical interface sends the loopback signal to the device under test. Thus, the QSFP loopback device can replace a QSFP optical module and an optical fibre to perform signal transmission in a device test process, which can avoid the QSFP optical module being damaged by being repeatedly plugged and pulled in the device test process, and avoid the service life being reduced as an unnecessary aging test is performed in a high-temperature aging test on a device, thereby being capable of solving the problem in the prior art that a device test easily causes damage to the QSFP optical module and reduces the service life.
机译:公开了一种用于测试的QSFP环回设备。环回设备包括:电接口和信号驱动单元。电接口与被测设备连接,并从被测设备接收电信号,即测试信号,信号驱动单元对电接口接收到的测试信号进行整形和放大处理,得到回送信号。电信号,然后电接口将环回信号发送到被测设备。这样,QSFP环回设备可以代替QSFP光模块和光纤在设备测试过程中进行信号传输,可以避免在设备测试过程中反复插拔QSFP光模块造成损坏,避免了QSFP环回设备的损坏。由于在设备的高温老化测试中进行了不必要的老化测试,使用寿命降低,从而能够解决现有技术中设备测试容易造成QSFP光模块损坏,使用寿命降低的问题。 。

著录项

  • 公开/公告号WO2014032523A1

    专利类型

  • 公开/公告日2014-03-06

    原文格式PDF

  • 申请/专利权人 ZTE CORPORATION;

    申请/专利号WO2013CN81473

  • 发明设计人 GUAN MINGBO;

    申请日2013-08-14

  • 分类号H04B10/07;

  • 国家 WO

  • 入库时间 2022-08-21 15:51:21

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号