首页>
外国专利>
QUAD SMALL FORM-FACTOR PLUGGABLE LOOPBACK DEVICE FOR TEST
QUAD SMALL FORM-FACTOR PLUGGABLE LOOPBACK DEVICE FOR TEST
展开▼
机译:四倍小型可插拔环回测试装置
展开▼
页面导航
摘要
著录项
相似文献
摘要
Disclosed is a QSFP loopback device for test. The loopback device comprises: an electrical interface and a signal drive unit. The electrical interface is connected to a device under test and receives an electric signal, i.e. a test signal, from the device under test, the signal drive unit performs shaping and amplification processing on the test signal received by the electrical interface to obtain a loopback signal of the electric signal, and the electrical interface sends the loopback signal to the device under test. Thus, the QSFP loopback device can replace a QSFP optical module and an optical fibre to perform signal transmission in a device test process, which can avoid the QSFP optical module being damaged by being repeatedly plugged and pulled in the device test process, and avoid the service life being reduced as an unnecessary aging test is performed in a high-temperature aging test on a device, thereby being capable of solving the problem in the prior art that a device test easily causes damage to the QSFP optical module and reduces the service life.
展开▼