首页> 外国专利> A SYSTEM FOR MEASURING A PARTICLE SIZE DISTRIBUTION OF PARTICLES OF A PARTICULATE MATTER

A SYSTEM FOR MEASURING A PARTICLE SIZE DISTRIBUTION OF PARTICLES OF A PARTICULATE MATTER

机译:一种测量颗粒物粒径分布的系统

摘要

It is an objective of the present invention to provide a system for measuring the particle size distribution of the particles of a particulate matter and, simultaneously, its crystalline nature. This objective is achieved according to the present invention by a system for measuring the particle size distribution of the particles of a particulate matter; comprising: a) a particle separation unit (4), such as a decanter unit, a centrifugal unit or a magnetic/electric field unit, being designed to force the particles (10a, 10b) to move through a moderating agent (8), such as liquid or a suspension; b) a radiation source (12) and a respective detector (14) enabled to measure dynamically the transmitted and/or particle absorbed amount of the incident light in at least a section of said particle acceleration unit (4), said measurement being preferably performable during predetermined time intervals; c) a radiation source (12) and a respective detector (14) enabled to simultaneously measure dynamically the beam - particle interaction, such as diffraction pattern, of the particles (10a, 10b) moving along at least a section of said particle acceleration unit (4), said measurement being preferably performable during predetermined time intervals. The present system therefore allows to measure both the particle size distribution as well as the crystalline nature of the powders at the same time thereby achieving a higher resolution within a shorter investigation period as compared to the methods known so far.
机译:本发明的目的是提供一种用于测量颗粒物质的颗粒的粒径分布以及同时测量其结晶性质的系统。根据本发明,该目的通过一种用于测量颗粒物质的颗粒的粒径分布的系统来实现。包括:a)颗粒分离单元(4),例如倾析器单元,离心单元或磁场/电场单元,其设计成迫使颗粒(10a,10b)移动通过缓和剂(8),如液体或悬浮液; b)辐射源(12)和相应的检测器(14),其能够动态地测量至少在所述颗粒加速单元(4)的一部分中的入射光的透射和/或颗粒吸收量,所述测量优选地是可执行的在预定的时间间隔内; c)辐射源(12)和相应的检测器(14),其能够同时动态地测量沿着所述粒子加速单元的至少一部分移动的粒子(10a,10b)的束-粒子相互作用,例如衍射图。 (4),所述测量优选地可在预定时间间隔内执行。因此,与迄今为止已知的方法相比,本系统允许同时测量粉末的粒度分布和结晶性,从而在较短的研究时间内实现了更高的分辨率。

著录项

  • 公开/公告号WO2014037219A1

    专利类型

  • 公开/公告日2014-03-13

    原文格式PDF

  • 申请/专利权人 PAUL SCHERRER INSTITUT;

    申请/专利号WO2013EP67355

  • 发明设计人 TESTINO ANDREA;

    申请日2013-08-21

  • 分类号G01N15/02;G01N15/04;G01N23/20;

  • 国家 WO

  • 入库时间 2022-08-21 15:51:08

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号