首页> 外国专利> METHOD AND X-RAY COMPUTER TOMOGRAPH FOR THE NON-DESTRUCTIVE TESTING OF OBJECTS CONSTRUCTED FROM MATERIAL LAYERS BY MEANS OF X-RAY COMPUTER TOMOGRAPHY

METHOD AND X-RAY COMPUTER TOMOGRAPH FOR THE NON-DESTRUCTIVE TESTING OF OBJECTS CONSTRUCTED FROM MATERIAL LAYERS BY MEANS OF X-RAY COMPUTER TOMOGRAPHY

机译:X射线计算机断层成像方法对材料层构成的对象进行非破坏性测试的方法和X射线计算机断层扫描

摘要

In a method for the non-destructive testing of objects constructed from material layers (17) running substantially parallel to an x-y plane (E), grey-scale value profiles and associated gradient profiles are determined from object data, obtained using X-ray computer tomography, along a plurality of evaluation directions (A1 to A5) running parallel to the x-y plane (E) and at a plurality of positions (Si) in a z direction which runs perpendicular to the x-y plane (E). An associated structure direction (22) can be inferred for each material layer (17) by evaluating the gradient profiles since the absorption of X-rays has a preferred direction which can be discerned in one of the gradient profiles. Objects constructed from a plurality of material layers (17) can be simply and reliably checked in a non-destructive manner in this way.
机译:在一种用于对由基本平行于xy平面(E)延伸的材料层(17)构造的对象进行无损检测的方法中,从使用X射线计算机获得的对象数据中确定灰度值轮廓和关联的梯度轮廓断层扫描,沿着平行于xy平面(E)延伸的多个评估方向(A1至A5),并在垂直于xy平面(E)的z方向的多个位置(Si)进行。由于X射线的吸收具有优选方向,该优选方向可以在其中一个梯度轮廓中辨别,因此可以通过评估梯度轮廓来推断每个材料层(17)的相关结构方向(22)。以此方式可以无损地简单且可靠地检查由多个材料层(17)构成的物体。

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