首页> 外国专利> PHOTOMETRIC ANALYSIS DEVICE AND PHOTOMETRIC ANALYSIS METHOD USING WAVELENGTH CHARACTERISTIC OF LIGHT EMITTED FROM SINGLE ILLUMINANT PARTICLE

PHOTOMETRIC ANALYSIS DEVICE AND PHOTOMETRIC ANALYSIS METHOD USING WAVELENGTH CHARACTERISTIC OF LIGHT EMITTED FROM SINGLE ILLUMINANT PARTICLE

机译:利用单个发光粒子发出的光的波长特征的光度分析装置和光度分析方法

摘要

The inventive technique of detecting and analyzing light from a light-emitting particle in accordance with the scanning molecule counting method using an optical measurement with a confocal microscope or a multiphoton microscope is characterized by detecting intensities of components of two or more wavelength bands of light from a light detection region of an optical system with moving the position of the light detection region in a sample solution by changing the optical path of the optical system of the microscope; detecting individually signals of the light from each light-emitting particle in the intensities of the components of the two or more wavelength bands of the detected light; and identifying a kind of light-emitting particle based on the intensities of the components of the two or more wavelength bands of the signals of the light of the detected light-emitting particle.
机译:通过使用共聚焦显微镜或多光子显微镜进行光学测量的,根据扫描分子计数方法检测和分析来自发光粒子的光的发明技术,其特征在于检测来自两个或多个波长带的光的成分的强度。光学系统的光检测区域,通过改变显微镜的光学系统的光路,使光检测区域在样品溶液中的位置移动。以检测到的光的两个或更多个波长带的分量的强度分别检测来自每个发光粒子的光的信号;根据检测出的发光粒子的光的信号的两个以上的波长带的成分的强度,识别发光粒子的种类。

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