BIMODAL METHOD FOR QUANTIFYING NON-TOPOGRAPHICAL PROPERTIES IN FORCE FIELD MICROSCOPY

摘要

The invention relates to a bimodal method for quantifying non-topographical properties in force field microscopy, based on simultaneously modulating, in terms of frequency, at least two vibration modes of the microlever of a microscope, which uses the frequency shifts of the excited modes and the changes in the excitation forces to quantify nanomechanical properties.