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Automatic testing apparatus for embedded software, automatic testing method thereof and test scenario composing method
Automatic testing apparatus for embedded software, automatic testing method thereof and test scenario composing method
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机译:嵌入式软件自动测试装置,其自动测试方法和测试场景组成方法
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摘要
An automatic test apparatus for embedded software, an automatic testing method thereof and a test scenario composing method may be used to detect an unpredictable problem as well as a predictable problem that may occur under user's conditions and reproduce various events. The automatic testing apparatus may include a keyword composer which extracts a keyword from status information output by executing the embedded software, and composes a keyword list using the extracted keywords, an output analyzer which analyzes the output from the execution of the embedded software based on the composed keyword list, a control command generator which loads at least one scenario previously stored in accordance with the analysis results, and generates an instruction list corresponding to a predetermined event status, and a test processor which processes the embedded software to reproduce the event status based on the generated instruction list.
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