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Automatic testing apparatus for embedded software, automatic testing method thereof and test scenario composing method

机译:嵌入式软件自动测试装置,其自动测试方法和测试场景组成方法

摘要

An automatic test apparatus for embedded software, an automatic testing method thereof and a test scenario composing method may be used to detect an unpredictable problem as well as a predictable problem that may occur under user's conditions and reproduce various events. The automatic testing apparatus may include a keyword composer which extracts a keyword from status information output by executing the embedded software, and composes a keyword list using the extracted keywords, an output analyzer which analyzes the output from the execution of the embedded software based on the composed keyword list, a control command generator which loads at least one scenario previously stored in accordance with the analysis results, and generates an instruction list corresponding to a predetermined event status, and a test processor which processes the embedded software to reproduce the event status based on the generated instruction list.
机译:用于嵌入式软件的自动测试设备,其自动测试方法和测试方案构成方法可以用于检测不可预测的问题以及在用户的条件下可能发生的可预测的问题,并再现各种事件。所述自动测试设备可以包括:关键字编写器,其从通过执行所述嵌入式软件输出的状态信息中提取关键字,并且使用所提取的关键字来组成关键字列表;输出分析器,其基于所述嵌入式软件来分析来自所述嵌入式软件的执行的输出。组成关键字列表,控制命令生成器,其加载至少一个根据分析结果预先存储的场景,并生成与预定事件状态相对应的指令列表,以及测试处理器,其处理嵌入式软件以基于在生成的指令列表上。

著录项

  • 公开/公告号EP2725494A1

    专利类型

  • 公开/公告日2014-04-30

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD;

    申请/专利号EP20130188768

  • 发明设计人 LEE BYEONG-HU;

    申请日2013-10-15

  • 分类号G06F11/36;

  • 国家 EP

  • 入库时间 2022-08-21 15:45:56

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