首页> 外国专利> APPARATUS FOR MEASURING CARRIER FREQUENCY OFFSET OF OFDM SIGNAL TRANSMITTED AND RECEIVED THROUGH MULTI-POLARIZED ANTENNAS AND METHOD FOR MEASURING CARRIER FREQUENCY OFFSET THEREOF

APPARATUS FOR MEASURING CARRIER FREQUENCY OFFSET OF OFDM SIGNAL TRANSMITTED AND RECEIVED THROUGH MULTI-POLARIZED ANTENNAS AND METHOD FOR MEASURING CARRIER FREQUENCY OFFSET THEREOF

机译：通过多极化天线传输和接收的OFDM信号的载波频率偏移的测量装置及其载波频率偏移的测量方法

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摘要

The present invention relates to an apparatus for measuring the carrier frequency offset of OFDM signals transmitted and received through a plurality of multi-polarized antennas and a method for measuring the carrier frequency offset thereof, which accurately measure the carrier frequency offset used for carrier frequency synchronization acquisition when there is interference between polarized waves.;COPYRIGHT KIPO 2014

机译：本发明涉及一种用于测量通过多个多极化天线发送和接收的OFDM信号的载波频率偏移的设备及其测量载波频率偏移的方法，其可以精确地测量用于载波频率同步的载波频率偏移。极化波之间存在干扰时进行采集。; COPYRIGHT KIPO 2014

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公开/公告号KR20140075095A

专利类型
公开/公告日2014-06-19

原文格式PDF
申请/专利权人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE;
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申请/专利号KR20120142894
发明设计人 KIM JUN WOOKR;CHO SE YOUNGKR;BANG YOUNG JOKR;PARK YOUN OKKR;SOHN KYUNG YEOLKR;
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申请日2012-12-10
分类号H04L27/26;
国家 KR
入库时间 2022-08-21 15:42:42

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