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TURBIDITY MEASURING APPARATUS AND TURBIDITY MEASURING METHOD

机译:浊度测定装置及浊度测定方法

摘要

The present invention relates to a turbidity measuring apparatus and a turbidity measuring method. Provided are a turbidity measuring apparatus which is characterized by comprising a first storage unit storing a fluid to be measured; a measuring container connected with the first storage unit through a first pipe and a second pipe; and a turbidity measuring unit measuring turbidity of the fluid to be measured, which is filled in the measuring container, wherein the fluid to be measured is moved between the first storage unit and the measuring container through the first pipe and the second pipe, and which can measure the turbidity of the fluid to be measured in real time by the movement of the fluid to be measured, and a turbidity measuring method.;COPYRIGHT KIPO 2014
机译:浊度测定装置及浊度测定方法技术领域本发明涉及浊度测定装置及浊度测定方法。提供一种浊度测量设备,其特征在于,包括:第一存储单元,存储要测量的流体;测量容器通过第一管和第二管与第一存储单元连接。浊度测量单元,其测量被测量流体的浊度,该浊度测量单元被填充在测量容器中,其中,被测量流体通过第一管道和第二管道在第一存储单元和测量容器之间移动,并且可以通过被测流体的运动和浊度测量方法实时测量被测流体的浊度。; COPYRIGHT KIPO 2014

著录项

  • 公开/公告号KR20140116660A

    专利类型

  • 公开/公告日2014-10-06

    原文格式PDF

  • 申请/专利权人 SAMSUNG SDI CO. LTD.;

    申请/专利号KR20130031505

  • 申请日2013-03-25

  • 分类号G01N15/06;G01N21/47;H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-21 15:42:04

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