TEST DATA PROCESSING DEVICE AND TEST DATA PROCESSING METHOD

摘要

is an object of the present invention, determining the defect of the foreign matter attached to the surface simply by using the conventional test method and foreign matter attached to the surface is to provide a test data processing apparatus and a test data processing method for processing data so as not treated as a defect. ; optic display member having at least a sheet-like optical film of the product of the apparatus As inspection of the data processing device (1) for processing test data obtained by testing the defects, on a laminate comprising an optical film or an optical film to a surface defect inspection data and defect bright spots on the surface is obtained when the inspected based on the luminescent spot inspection data, and a location and position of the spots of the surface defects in the same case, the surface defect and the bright spot defect information writing process, not a disadvantage as a part of the same location (6).