DEVICE AND METHOD FOR MEASURING MECHANICAL PROPERTIES OF FREE-STANDING NANOFILM

摘要

The present invention provides a device and a method for measuring mechanical properties of a free-standing nanofilm and, specifically, to a device and a method for measuring the tensile properties of a free-standing nanofilm for specimens with a thickness of 100 nm or less using a separately manufactured jig after floating the free-standing nanofilm on a floating liquid and maintaining the shape of the free-standing thin film.;COPYRIGHT KIPO 2014