首页> 外国专利> Optical examination of the surface or a layer of an object or medium, whereby the surface is illuminated with polarized visual radiation and reflected or scattered radiation is measured on an area by area basis

Optical examination of the surface or a layer of an object or medium, whereby the surface is illuminated with polarized visual radiation and reflected or scattered radiation is measured on an area by area basis

机译:对物体或介质的表面或一层进行光学检查,从而用偏振视觉辐射照亮该表面,并按区域逐个测量反射或散射的辐射

摘要

Method for examining a surface (12) or a layer in which polarized visual radiation (18) is used to illuminate the surface or layer and measurement radiation (36) reflected or scattered originating from locations (38) on the surface is measured to determine surface polarization properties. Independent claims are also included for the following:- (a) a device for examining the polarization properties of a surface and; (b) a sensor for measuring optical radiation with a field of photodetector elements over which a polarization filter, especially in the form of a metal, is applied.
机译:检查表面(12)或层的方法,其中使用偏振可视辐射(18)照射表面或层,并测量源自表面上位置(38)的反射或散射的测量辐射(36),以确定表面极化性质。还包括以下方面的独立权利要求:-(a)检查表面的偏振特性的装置;以及(b)一种用于在具有光检测器元件的场的情况下测量光辐射的传感器,在该光检测器元件的场上施加了偏振滤波器,尤其是金属形式的偏振滤波器。

著录项

  • 公开/公告号DE10362349B3

    专利类型

  • 公开/公告日2014-05-08

    原文格式PDF

  • 申请/专利权人 SICK AG;

    申请/专利号DE2003162349

  • 发明设计人 BLÖHBAUM FRANK;

    申请日2003-08-12

  • 分类号G01N21/21;H01L31/0232;

  • 国家 DE

  • 入库时间 2022-08-21 15:38:12

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