首页> 外国专利> Confocal laser-scanning microscope for examining a sample

Confocal laser-scanning microscope for examining a sample

机译:共聚焦激光扫描显微镜检查样品

摘要

Confocal laser-scanning microscope (20) for examining a sample (46), with a light source (22), which generates a illumination light beam (24),a scanning unit (38), the illuminating light beam (24) in such a way that it deflects the sample (46) is optically scans,a main beam splitter (34), the illuminating light beam (24) from the specimen (46) extending detection light (48) separates,a detection pinhole (50), as a result of the at least partially from the illuminating light beam (24) of the separate detection light (48),at least two detector units (102, 104, 106), which the by the detection pinhole (50) detection light (48) is adapted to detect,and, with an optical element (62), which in the beam direction between the detection pinhole (50) and the detector units (102, 104, 106) is arranged, and in which the detection light (48) in at least two beam (70, 72, 74) and within the bundle of rays (70, 72, 74) is split spectrally.
机译:用于检测样品(46)的共焦激光扫描显微镜(20),具有产生照明光束(24)的光源(22),扫描单元(38),在其中的照明光束(24)用光学方法扫描偏斜样品(46)的方式,主分束器(34),来自延伸检测光(48)的样本(46)的照明光束(24),检测针孔(50),由于至少部分地来自分离的检测光(48)的照明光束(24),至少两个检测器单元(102、104、106)被检测针孔(50)检测到( 48)适于检测光学元件(62),并利用光学元件(62)在检测针孔(50)和检测器单元(102、104、106)之间的光束方向上布置检测光(在至少两个光束(70、72、74)中并且在光束(70、72、74)内在光谱上分开(图48)。

著录项

  • 公开/公告号DE102010060747B4

    专利类型

  • 公开/公告日2014-04-03

    原文格式PDF

  • 申请/专利权人 LEICA MICROSYSTEMS CMS GMBH;

    申请/专利号DE20101060747

  • 发明设计人 REINER RYGIEL;

    申请日2010-11-23

  • 分类号G02B21/00;G01J3/14;G01J3/36;G01N21/64;

  • 国家 DE

  • 入库时间 2022-08-21 15:38:04

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号