首页> 外国专利> Abrasion measuring device for measuring abrasive wear of surface of e.g. dental prosthesis, has module carrier arranged perpendicular to first axis, which is provided perpendicular to second and third axes

Abrasion measuring device for measuring abrasive wear of surface of e.g. dental prosthesis, has module carrier arranged perpendicular to first axis, which is provided perpendicular to second and third axes

机译:磨损测量装置,用于测量例如牙科假体,具有垂直于第一轴布置的模块载体,该模块载体垂直于第二轴和第三轴设置

摘要

The device has a sample retainer (5b) for retaining a sample. A module carrier (4) is arranged parallel to the sample retainer. A CMOS-camera (8) and a laser sensor (12) are arranged at the module carrier. The sample retainer and the module carrier are movable relative to each other along a first axis (X) and/or a second axis (Y), which stays perpendicular to the first axis. The module carrier is arranged perpendicular to a third axis (Z), which is provided perpendicular to the first and second axes. A LED (9) is arranged at the module carrier. An independent claim is also included for a method for measuring an abrasive wear of a surface of a sample.
机译:该装置具有用于保持样品的样品保持器(5b)。模块载体(4)平行于样品保持器布置。 CMOS相机(8)和激光传感器(12)布置在模块载体处。样品保持器和模块载体可沿着垂直于第一轴线的第一轴线(X)和/或第二轴线(Y)彼此相对移动。模块载体垂直于第三轴线(Z)布置,第三轴线(Z)垂直于第一轴线和第二轴线设置。 LED(9)布置在模块支架上。还包括用于测量样品表面的磨料磨损的方法的独立权利要求。

著录项

  • 公开/公告号DE102012105923A1

    专利类型

  • 公开/公告日2014-01-09

    原文格式PDF

  • 申请/专利权人 SD MECHATRONIK GMBH;

    申请/专利号DE201210105923

  • 发明设计人 DUY SEBASTIAN;DUY WERNER;

    申请日2012-07-03

  • 分类号G01N3/56;G01B11/02;A61C19/04;

  • 国家 DE

  • 入库时间 2022-08-21 15:37:49

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