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Continuous correction of phase errors of a multi-dimensional, location-selective magnetic resonance - measuring sequence

机译:连续校正多维位置选择磁共振的相位误差-测量序列

摘要

Various embodiments relate to a process for the continuous correction of phase errors in the case of a magnetic resonance - measuring sequence (5), in which a plurality of sequentially irradiated multi-dimensional location-selective high frequency - excitation pulses (1) is used. The method comprises the detection of a plurality of calibration signal gradient echoes ion - in a calibration signal ion - recording sequence (2) and calculating a correction value for a phase response and a correction value for a phase difference of the plurality of calibration signal gradient echoes ion -. The method further includes the introduction in the form of a further high frequency - excitation pulse (1), wherein said irradiating the correction values are taken into account.
机译:各个实施例涉及在磁共振测量序列(5)中用于连续校正相位误差的方法,其中使用多个顺序照射的多维位置选择性高频激励脉冲(1) 。该方法包括:在校准信号离子记录序列(2)中检测多个校准信号梯度回波离子,并计算多个校准信号梯度的相位响应校正值和相位差校正值。回声离子-。该方法还包括以另一高​​频激励脉冲(1)的形式引入,其中考虑到所述辐射校正值。

著录项

  • 公开/公告号DE102012208425B4

    专利类型

  • 公开/公告日2013-12-12

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号DE201210208425

  • 发明设计人 JOSEF PFEUFFER;THORSTEN SPECKNER;

    申请日2012-05-21

  • 分类号G01R33/561;G01R33/54;

  • 国家 DE

  • 入库时间 2022-08-21 15:37:44

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