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FOURIER INTERFERENCE SPECTROMETER AND SPECTRAL INTENSITY MEASUREMENT METHOD

机译:傅里叶干涉谱仪和光谱强度测量方法

摘要

PROBLEM TO BE SOLVED: To provide a Fourier interference spectrometer capable of precisely measuring the spectral intensity of an incoming beam even when the intensity of the incoming beam changes in a time-variant manner.;SOLUTION: The Fourier interference spectrometer includes: an intensity monitoring section 3 which has an optical axis in a direction parallel to the optical axis of a beam interference section 1 for measuring the intensity of an incoming beam; and a gain adjustment section 4 that sets an inverse number of an intensity of the incoming beam measured by the intensity monitoring section 3 as a gain coefficient and multiplies the intensity of a synthetic light flux detected by a beam intensity detection section 2 by the gain coefficient. With this, the spectral intensity of an incoming beam can be precisely measured even when the intensity of the incoming beam changes in a time-variant manner.;COPYRIGHT: (C)2015,JPO&INPIT
机译:解决的问题:提供一种即使在入射光束的强度随时间变化的情况下也能够精确测量入射光束的光谱强度的傅立叶干涉光谱仪;解决方案:傅立叶干涉光谱仪包括:强度监控部件3,其光轴在平行于光束干涉部件1的光轴的方向上,用于测量入射光束的强度;增益调整部4,将由强度监视部3测量出的入射光束的强度的倒数设为增益系数,并将由光束强度检测部2检测出的合成光束的强度乘以增益系数。 。这样一来,即使入射光束的强度随时间变化,也可以精确地测量入射光束的光谱强度。;版权所有:(C)2015,JPO&INPIT

著录项

  • 公开/公告号JP2015064228A

    专利类型

  • 公开/公告日2015-04-09

    原文格式PDF

  • 申请/专利权人 MITSUBISHI ELECTRIC CORP;

    申请/专利号JP20130197116

  • 发明设计人 NAKANO YOSHITAKA;

    申请日2013-09-24

  • 分类号G01J3/45;G01J3/02;

  • 国家 JP

  • 入库时间 2022-08-21 15:32:45

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