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current probe, current probe measurement system and the current probe measuring method

机译:电流探头,电流探头测量系统和电流探头测量方法

摘要

PROBLEM TO BE SOLVED: To provide a current probe to reduce a measurement error caused by the influence of unnecessary magnetic field which is generated from an object not to be measured adjacent to an object to be measured in a current measurement.;SOLUTION: The current probe includes: a sensor for detecting a magnetic field; transmission lines connected to the sensor; and a pair of conductive members arranged so as to face the sensor while projecting to a forward direction from a tip of the sensor. A forward direction of the sensor, which is surrounded by the projected part of the conductive member, is opened in the surface direction of facing the conductive member.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种电流探针,以减少由于不必要的磁场的影响而导致的测量误差,该不必要的磁场是由电流测量中与待测物体相邻的待测物体产生的。探头包括:用于检测磁场的传感器;以及传输线连接到传感器;一对导电构件布置成面对传感器,同时从传感器的尖端向向前方向突出。由导电部件的突出部分围绕的传感器的向前方向在面向导电部件的表面方向上打开。;版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP5798863B2

    专利类型

  • 公开/公告日2015-10-21

    原文格式PDF

  • 申请/专利权人 株式会社日立製作所;

    申请/专利号JP20110213708

  • 发明设计人 船戸 裕樹;須賀 卓;

    申请日2011-09-29

  • 分类号G01R29/08;

  • 国家 JP

  • 入库时间 2022-08-21 15:31:23

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