Test system and method for testing high voltage technology equipment

摘要

The invention relates to a test system for high-voltage technology equipment, in particular shunt reactors, as described in the superordinate concept of the independent claim 1. Furthermore, the invention relates to a method that can be implemented by this test system for testing a high-voltage technology device according to claim 5. The abstract idea of the test system of the present invention is to provide a continuously adjustable inductance and a capacitance adjustable in discontinuous steps on the secondary side of the test transformer. In a method that can be implemented using the test system of the present invention, when the undercapacitance in the test system is measured by a measuring device, the individual capacitances of the capacitor bank are turned on by an iterative process. Or when the excess capacitance is measured by the measuring device, the individual capacitances are turned off until the pre-determined threshold dominates. Since the adjustment is performed by the discontinuously adjustable capacitance of the capacitor bank, subsequent fine adjustment of the test system is performed by the continuously adjustable inductance. Thus, these components together form a series resonant circuit with a test object formed as an inductance. This series resonant circuit can be tuned to its resonant point.