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Scattered light detecting device and the scattered light detection method

机译:散射光检测装置及散射光检测方法

摘要

PROBLEM TO BE SOLVED: To precisely detect scattered light generated from an object to be measured by irradiating the object to be measured with a plurality of kinds of measurement light having different wavelengths from each other after being switched.;SOLUTION: A scattered light detector includes: a support part which supports an object to be measured; a plurality of light sources arranged in mutually different positions which can irradiate the object to be measured supported by a support part with a plurality of measurement light, respectively; a detector which detects scattered light respectively generated from the object to be measured irradiated with the plurality of measurement light; and a movement mechanism capable of moving the detector in a measurement region which is a region not including a light path to the object to be measured of the measurement light and capable of detecting the scattered light.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:在切换之后,通过用波长互不相同的多种测量光照射被测物体,来精确地检测从被测物体产生的散射光。 :支撑被测量物体的支撑部分;在相互不同的位置上布置的多个光源,分别以多个测量光照射在由支撑部支撑的被测量物上。检测器,其检测被多个测定光照射的分别从被测定物产生的散射光。 COPYRIGHT:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP5685514B2

    专利类型

  • 公开/公告日2015-03-18

    原文格式PDF

  • 申请/专利权人 富士フイルム株式会社;

    申请/专利号JP20110215985

  • 发明设计人 堀井 和由;

    申请日2011-09-30

  • 分类号G01N21/47;G01N21/27;

  • 国家 JP

  • 入库时间 2022-08-21 15:30:49

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