Fluctuation field resistance testing apparatus for electronic devices, variations field resistance testing method of an electronic device

摘要

In the testing apparatus, the electronic apparatus to be measured, and the mixture was exposed to an electric field applied by the electrodes, is varied by an electric field varying means, the strength of the electric field applied to the electronic device during inspection. By the variations of the electric field in the examination, to cause electrostatic induction to the inside of electronic devices, to check the operating characteristics of the electronic device. Result, it is not possible to test the ESD conventional test apparatus, it is possible to test a malfunction due to the discharge phenomenon that occurs in the electronic equipment inside.