首页> 外国专利> PROBE FOR NEAR ELECTRIC FIELD MEASUREMENT AND NEAR ELECTRIC FIELD MEASUREMENT SYSTEM USING THE SAME

PROBE FOR NEAR ELECTRIC FIELD MEASUREMENT AND NEAR ELECTRIC FIELD MEASUREMENT SYSTEM USING THE SAME

机译:近场测量探针和使用该方法的近场测量系统

摘要

PROBLEM TO BE SOLVED: To provide a probe for near electric field measurement which achieves accurate near electric field measurement, and a near electric field measurement system using the same.;SOLUTION: A probe for near electric field measurement includes: a near electric field detection element; a disturbance electric field detection element; and a transmission line for transmitting signals detected by the near electric field detection element and the disturbance electric field detection element. The disturbance electric field detection element is provided so as to detect an electromagnetic field in the same polarization direction as that of an electromagnetic field detected by the near electric field detection element and output a signal with a polarity opposite to that of a signal outputted from the near electric field detection element, and the transmission line is structured to output an addition signal of the detection signals of the near electric field detection element and the disturbance electric field detection element.;COPYRIGHT: (C)2015,JPO&INPIT
机译:解决的问题:提供一种能够实现精确的近场测量的近场测量探头以及使用该探头的近场测量系统。解决方案:远场测量探头包括:近场检测元件;干扰电场检测元件;传输线用于传输由附近电场检测元件和干扰电场检测元件检测到的信号。设置干扰电场检测元件以检测与由近电场检测元件检测的电磁场的极化方向相同的极化方向的电磁场,并输出与从该电场输出的信号相反极性的信号。接近电场检测元件,传输线被构造为输出接近电场检测元件和干扰电场检测元件的检测信号的相加信号。;版权所有:(C)2015,JPO&INPIT

著录项

  • 公开/公告号JP2015001458A

    专利类型

  • 公开/公告日2015-01-05

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP20130126258

  • 申请日2013-06-17

  • 分类号G01R29/08;

  • 国家 JP

  • 入库时间 2022-08-21 15:29:18

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号