Optical apparatus for observing the millimeter or sub-millimeter structural details of the object with specular behavior

摘要

A device for observation, by reflection or transmission, of the structural details of an object (2) that exhibits a behaviour that is at least partially specular, located in an exposure area, which includes: - at least one radiation source with an emission surface (6), - an optical projection system that is located in line with the radiation source in relation to the exposure zone, in the path of the radiation, - an optical exposure system (18) designed to optically link the entry aperture (14) of the optical projection system and the emission surface (6), - a projection surface (10) that is linked optically with the object in the exposure zone, and whose received radiation depends on the deflection on the object (2).