首页> 外国专利> Magnetic particle flaw detector and magnetic particle testing method

Magnetic particle flaw detector and magnetic particle testing method

机译:磁粉探伤仪及磁粉检测方法

摘要

PROBLEM TO BE SOLVED: To provide a magnetic particle testing device and method for preventing fluorescence of a fluorescent magnetic particle around a conveyed billet from being falsely recognized as fluorescence of the fluorescent magnetic particle adhered on a flaw on the surface of the billet, and ensuring high flaw detection accuracy even if an inclination of the billet surface is changed.;SOLUTION: A magnetic particle testing device 1 includes: a magnetization part 2 for magnetizing a testing area; a magnetic particle diffusing part 3 that diffuses fluorescent magnetic particles; an ultraviolet ray irradiation part 4 that makes the fluorescent magnetic particle fluorescent irradiating it with ultraviolet ray; a slit light irradiation part 5 that irradiates positions on the upstream and downstream sides in the conveyance direction of the testing area, with slit light; an imaging part 6; and an image processing part 7. The image processing part 7 corrects the concentration of a pixel group corresponding to the fluorescent magnetic particle in a captured image to a concentration to be obtained when a first inclination angle formed by an ultraviolet ray irradiation direction of the ultraviolet ray irradiation part with respect to a normal direction of the billet surface is changed to a first correction angle and a second inclination angle formed by the imaging direction of an imaging part with respect to the normal direction of the billet surface is changed to a second correction angle, to detect a flaw on the basis of the corrected captured image.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种磁粉检测装置和方法,用于防止被输送的钢坯周围的荧光磁粉的荧光被错误地识别为粘附在钢坯表面缺陷上的荧光磁粉的荧光,并确保解决方案:磁粉探伤装置1包括:磁化部2,用于使测试区域磁化;磁性粒子扩散部3扩散荧光磁性粒子。紫外线照射部4,使荧光磁性粒子以紫外线进行荧光照射。狭缝光照射部5向狭缝光照射在检查区域的输送方向的上游侧和下游侧的位置。成像部分6;图像处理部7将与摄像图像中的荧光磁性粒子相对应的像素组的浓度校正为由紫外线的紫外线照射方向形成的第一倾斜角时的浓度。相对于坯料表面的法线方向的射线照射部分被改变为第一校正角,并且由成像部分相对于坯料表面的法线方向的成像方向形成的第二倾斜角被改变为第二校正角。角度,以根据校正后的捕获图像检测缺陷。;版权:(C)2013,JPO&INPIT

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号