首页> 外国专利> Analysis support apparatus , and surface plasmon resonance fluorescence analysis apparatus equipped with this analysis support apparatus

Analysis support apparatus , and surface plasmon resonance fluorescence analysis apparatus equipped with this analysis support apparatus

机译:分析支持装置以及具备该分析支持装置的表面等离子体共振荧光分析装置

摘要

PROBLEM TO BE SOLVED: To provide an analysis support device which supports analysis of a specimen by a surface plasmon resonance fluorescence analyzer by detecting a metal film inappropriate to the analysis of the specimen, so as to maintain analysis accuracy of the specimen, and to provide the surface plasmon resonance fluorescence analyzer having the analysis support device.;SOLUTION: An analysis support device 40 and a surface plasmon resonance fluorescence analyzer 10 having the analysis support device 40 of the present invention comprise: a defective area detection part 41 for detecting a defective area where a defect is generated in a metal film 55; and a determination part 42 which, when a value for the defective area is under a predetermined threshold value, determines that the metal film 55 is appropriate to analysis of a specimen and outputs the determination result to the outside, and when the value for the defective area is equal to or above the predetermined threshold value, determines that the metal film 55 is inappropriate to the analysis of the specimen and outputs the determination result to the outside.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种分析支持装置,其通过检测不适合样品分析的金属膜来支持通过表面等离子体共振荧光分析仪对样品的分析,从而保持样品的分析精度,并提供解决方案:分析支持装置40和具有本发明分析支持装置40的表面等离子体共振荧光分析仪10包括:缺陷区域检测部分41,用于检测缺陷。在金属膜55中产生缺陷的区域。判定部42,当所述缺陷区域的值在规定的阈值以下时,判定为所述金属膜55适合于检体的分析,将判定结果输出到外部;面积等于或大于预定阈值,确定金属膜55不适合分析样品,并将确定结果输出到外部。版权所有:(C)2012,JPO&INPIT

著录项

  • 公开/公告号JP5636921B2

    专利类型

  • 公开/公告日2014-12-10

    原文格式PDF

  • 申请/专利权人 コニカミノルタ株式会社;

    申请/专利号JP20100268446

  • 发明设计人 米山 正利;

    申请日2010-12-01

  • 分类号G01N21/64;

  • 国家 JP

  • 入库时间 2022-08-21 15:27:40

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