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METHOD FOR TESTING TUNABLE WAVELENGTH LASER DEVICE AND TUNABLE WAVELENGTH LASER DEVICE

机译:可调谐波长激光装置的测试方法及可调谐波长激光装置

摘要

A method for testing a tunable wavelength laser device, which can suppress any error of light transmission characteristics of an etalon, and a tunable wavelength laser device are provided. The method for testing a tunable wavelength laser device is a method for testing a tunable wavelength laser device including a tunable wavelength laser and a wavelength sensing unit having an etalon. The testing method includes a fast step of measuring a free spectral range interval of the etalon, a second step of acquiring a driving condition by tuning a wavelength to a target value provided between a top and a bottom of the free spectral range interval, and a third step of storing the driving condition in a memory.
机译:本发明提供一种可抑制标准具的透光特性的误差的波长可调激光装置的测试方法以及波长可调激光装置。用于测试可调波长激光器的方法是用于测试包括可调波长激光器和具有标准具的波长感测单元的可调波长激光器的方法。该测试方法包括测量标准具的自由光谱范围间隔的快速步骤,通过将波长调谐到在自由光谱范围间隔的顶部和底部之间提供的目标值来获取驾驶条件的第二步骤,以及第三步骤,将驾驶条件存储在存储器中。

著录项

  • 公开/公告号US2015117478A1

    专利类型

  • 公开/公告日2015-04-30

    原文格式PDF

  • 申请/专利权人 SUMITOMO ELECTRIC INDUSTRIES LTD.;

    申请/专利号US201414527699

  • 发明设计人 EIICHI BANNO;

    申请日2014-10-29

  • 分类号H01S5/06;H01S5/00;

  • 国家 US

  • 入库时间 2022-08-21 15:23:08

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