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Storage Module and Low-Complexity Methods for Assessing the Health of a Flash Memory Device
Storage Module and Low-Complexity Methods for Assessing the Health of a Flash Memory Device
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机译:用于评估闪存设备状态的存储模块和低复杂度方法
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摘要
A storage module and low-complexity methods for assessing the health of a flash memory device are disclosed. In one embodiment, data is written to a subset of memory cells in a memory of a storage module. Error statistics for the subset of memory cells are determined, and cell error rate parameters for the memory are estimated by fitting the determined error statistics for the subset of memory cells with a parametric statistical model. Other embodiments are possible, and each of the embodiments can be used alone or together in combination.
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