System and method for testing a radio frequency (RF) multiple-input-multiple-output (MIMO) device under test (DUT)

摘要

A system and method for testing a radio frequency (RF) multiple-input-multiple-output (MIMO) device under test (DUT) in which system costs are minimized by using fewer precision RF MIMO testing subsystems together with lower precision integrated RF MIMO signal conversion circuitry to test the DUT.