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Sketched overdrawn lines for editing spline-based three-dimensional curves

机译:草绘的覆盖线,用于编辑基于样条线的三维曲线

摘要

An overdraw method for editing a three-dimensional geometry includes receiving a three-dimensional geometry including a plurality of individual curves whose positions are defined by a plurality of control points, receiving a polyline overdrawn on the three-dimensional geometry, matching the polyline to the three-dimensional geometry to determine a portion of the three-dimensional geometry being modified, recognizing a shape feature of the polyline to determine a shape modification to apply to the three-dimensional geometry, shifting the three-dimensional geometry to determine a modified geometry by changing a position of at least one of the control points towards the polyline, and matching the modified geometry with at least one symmetry operator to determine whether the changed position satisfies a constraint and applying the constraint to the modified geometry to further modify the modified geometry.
机译:一种用于编辑三维几何图形的透支方法,包括:接收包括多个单独曲线的三维几何图形,其位置由多个控制点定义;接收在三维几何图形上透支的折线,将折线与三维几何来确定要修改的三维几何的一部分,识别折线的形状特征以确定要应用于三维几何的形状修改,通过移动三维几何来确定修改的几何改变至少一个控制点朝向折线的位置,并将修改后的几何形状与至少一个对称运算符进行匹配,以确定更改后的位置是否满足约束,并将该约束应用于修改后的几何形状以进一步修改修改后的几何形状。

著录项

  • 公开/公告号US8928652B2

    专利类型

  • 公开/公告日2015-01-06

    原文格式PDF

  • 申请/专利权人 RICHARD GARY MCDANIEL;

    申请/专利号US201113105058

  • 发明设计人 RICHARD GARY MCDANIEL;

    申请日2011-05-11

  • 分类号G06T15/20;G06T15/00;G06T19/20;

  • 国家 US

  • 入库时间 2022-08-21 15:16:41

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