An insulation condition assessment instrument for performing frequency domain spectroscopy employing time growing frequency excitation and a method for the same

摘要

AN INSULATION CONDITION ASSESSMENT INSTRUMENT FOR PERFORMING FREQUENCY DOMAIN SPECTROSCOPY EMPLOYING TIME GROWING FREQUENCY EXCITATION AND A METHOD FOR THE SAME An insulation condition assessment instrument (A) comprises of at least two switches 1 and 2 for connecting two terminals (x, y) of a dielectric material sample (7) under test to the common connection points (c) and (d) of said two switches, a host computer (14) connected to a microcontroller (3) which is connected through 8/16/32 bit data bus to FPGA (4). FGPA (4) is connected to high voltage amplifier (6) as well as to ADC (10, 11), which is in turn connected to a programmable voltage sensing unit (9) and a programmable current sensing unit (8), respectively. A time growing frequency excitation voltage waveform is impressed by said high voltage amplifier (6) upon the dielectric sample (7). A process of performing FDS with instrument (A) is also disclosed. Fig. 1