首页> 外国专利> A METHOD OF LOCAL TRACING OF CONNECTIVITY AND SCHEMATIC REPRESENTATIONS PRODUCED THEREFROM

A METHOD OF LOCAL TRACING OF CONNECTIVITY AND SCHEMATIC REPRESENTATIONS PRODUCED THEREFROM

机译:刷新的局部连通性和局部表示的局部跟踪方法

摘要

A schematic diagram detailing a circuit that was reverse engineered from a plurality of images taken of the circuit is provided. The schematic diagram comprises at least one circuit element that was represented as an object in at least one of the plurality of images, such that signal continuity information was determined through local tracing of connectivity between a first image and a second image of the plurality of images. A method of tracing the connectivity within the plurality of images to produce the schematic diagram is also disclosed.
机译:提供了详细描述电路的示意图,该电路是根据从该电路拍摄的多个图像进行反向工程设计的。示意图包括在多个图像中的至少一个中被表示为对象的至少一个电路元件,从而通过对多个图像中的第一图像和第二图像之间的连通性进行局部跟踪来确定信号连续性信息。还公开了一种跟踪多个图像内的连通性以产生示意图的方法。

著录项

  • 公开/公告号CA2605234C

    专利类型

  • 公开/公告日2015-05-05

    原文格式PDF

  • 申请/专利权人 SEMICONDUCTOR INSIGHTS INC.;

    申请/专利号CA20072605234

  • 发明设计人 KEYES EDWARD;ZAVADSKY VYACHESLAV L.;

    申请日2007-10-03

  • 分类号G06T7;G06F30/30;

  • 国家 CA

  • 入库时间 2022-08-21 15:11:43

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