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Development support apparatus of semiconductor device, development support method, and development support program product

机译:半导体器件的开发支持装置,开发支持方法和开发支持程序产品

摘要

Disclosed is a development support apparatus of a semiconductor device that makes it possible to easily develop the semiconductor device, a development support method, and a program product. A design evaluation apparatus is a design evaluation apparatus having an analog front-end unit for inputting a measurement signal of a sensor and an MCU unit, which has a GUI processing unit for displaying a GUI corresponding to a circuit configuration of the analog front-end unit and a register setting unit that generates setting information for setting up the circuit configuration and a circuit characteristic of the analog front-end unit based on an operation of the GUI by a user, and sets the generated setting information in the analog front-end unit through the MCU unit.
机译:公开了一种使得可以容易地对半导体器件进行显影的半导体器件的显影支持装置,显影支持方法和程序产品。设计评估装置是具有用于输入传感器的测量信号的模拟前端单元和MCU单元的设计评估装置,该MCU单元具有用于显示与模拟前端的电路配置相对应的GUI的GUI处理单元。单元和寄存器设置单元,其基于用户的GUI操作来生成用于设置模拟前端单元的电路配置和电路特性的设置信息,并将所生成的设置信息设置在模拟前端中通过MCU单元。

著录项

  • 公开/公告号EP2595075A3

    专利类型

  • 公开/公告日2015-05-27

    原文格式PDF

  • 申请/专利权人 RENESAS ELECTRONICS CORPORATION;

    申请/专利号EP20120191446

  • 发明设计人 SHIMIZU YUJI;

    申请日2012-11-06

  • 分类号G06F17/50;

  • 国家 EP

  • 入库时间 2022-08-21 15:07:00

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