WAVELENGTH SCANNING ANALYSIS APPARATUS AND METHOD

摘要

Provided are an analysis apparatus and an analysis method for reliably eliminating the effects of components that interfere with measurement and improving the accuracy of measuring a component to be measured. Light from a light source is scanned in a specific scanning band at a predetermined scanning frequency by an interference filter (12), and the light is irradiated on a sample solution. The light that has passed through an optical cell (18) is converted into an electrical signal by a photodetector (20). A processing unit (22) performs fast Fourier transformation on the signal, and quantifies the component to be measured using the intensity of a specific harmonic component among the harmonic components of the scanning frequency, e.g., the second-order or third-order harmonic. Which harmonic component to use is determined in accordance with the component to be measured and components that interfere with measurement.