首页> 外国专利> MICRO-MACHINED ELECTRON MULTIPLIER FOR DETECTING IONISING PARTICLES, SYSTEM FOR DETECTING IONISING PARTICLES, AND METHOD FOR PRODUCING SAID DEVICE

MICRO-MACHINED ELECTRON MULTIPLIER FOR DETECTING IONISING PARTICLES, SYSTEM FOR DETECTING IONISING PARTICLES, AND METHOD FOR PRODUCING SAID DEVICE

机译:用于检测电离颗粒的微机械电子倍增器,用于检测电离颗粒的系统和用于生产所述装置的方法

摘要

The invention relates to a micro-machined and stackable electron multiplier (1) for detecting ionising particles, said device comprising: a solid substrate having a micro-machined central cavity (14) in the centre of the lower face of the substrate, defining a substrate-supporting peripheral contour (12) around the cavity, and having a plurality of micro-machined through-openings (13) arranged in communication with the cavity (14); a first dielectric insulating layer (17) deposited on all the surfaces of the solid substrate; a first polarising metallic electrode (15) arranged on the upper face of the first electric insulating layer (17); and a second polarising metallic electrode (16) arranged on the lower face of the first electric insulating layer (17).
机译:本发明涉及一种用于检测电离粒子的微机械且可堆叠的电子倍增器(1),所述装置包括:固体基板,在所述基板的下表面的中心具有微机械的中心腔(14),其限定了围绕腔的衬底支撑外围轮廓(12),并具有多个与腔(14)连通的微加工通孔(13);沉积在固体衬底的所有表面上的第一介电绝缘层(17);在第1电绝缘层(17)的上面配置第1极化金属电极(15)。在第1电绝缘层(17)的下面配置有第2极化金属电极(16)。

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