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SINGLE-PARTICLE DETECTION DEVICE USING PHOTOANALYSIS, SINGLE-PARTICLE DETECTION METHOD, AND COMPUTER PROGRAM FOR SINGLE-PARTICLE DETECTION

机译:利用光分析的单颗粒检测装置,单颗粒检测方法和用于单颗粒检测的计算机程序

摘要

There is provided a single particle detection technique based on the scanning molecule counting method which individually detects single particles using light measurement with a confocal microscope or multiphoton microscope, where the existences of a non-light-emitting particle and a light-emitting particle can be detected while being discriminated from one another in a sample solution including the non-light-emitting particle and light-emitting particle. The inventive technique of detecting a single particle in a sample solution detects light from a light detection region during moving the position of the light detection region of the microscope in a sample solution containing a non-light-emitting particle and a light-emitting particle to generate time series light intensity data; and detects in the time series light intensity data a light intensity increase relative to background light intensity as a signal indicating the existence of the light-emitting particle and a light intensity reduction relative to the background light intensity as a signal indicating the existence of the non-light-emitting particle.
机译:提供了一种基于扫描分子计数法的单粒子检测技术,该单分子检测技术使用共聚焦显微镜或多光子显微镜通过光测量分别检测单个粒子,其中可以存在非发光粒子和发光粒子。在包括非发光粒子和发光粒子的样品溶液中彼此区分的同时进行检测。用于检测样品溶液中单个颗粒的发明技术在将包含非发光颗粒和发光颗粒的样品溶液中的显微镜的光检测区域的位置移动到以下位置期间检测来自光检测区域的光:产生时间序列光强度数据;并在时间序列光强度数据中检测相对于背景光强度的光强度增加作为指示发光粒子的存在的信号以及相对于背景光强度的光强度减少作为指示不存在发光粒子的信号-发光粒子。

著录项

  • 公开/公告号EP2840380A1

    专利类型

  • 公开/公告日2015-02-25

    原文格式PDF

  • 申请/专利权人 OLYMPUS CORPORATION;

    申请/专利号EP20130777928

  • 发明设计人 HANASHI TAKUYA;

    申请日2013-03-11

  • 分类号G01N21/64;G02B21/00;

  • 国家 EP

  • 入库时间 2022-08-21 15:03:32

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