首页> 外国专利> METHOD FOR DETERMINING THE AMOUNT OF AN ANALYTE BY MASS SPECTROMETRY WITH THE!HELP OF SPECIALLY DESIGNED DEUTERATED ANALYTE ANALOGS

METHOD FOR DETERMINING THE AMOUNT OF AN ANALYTE BY MASS SPECTROMETRY WITH THE!HELP OF SPECIALLY DESIGNED DEUTERATED ANALYTE ANALOGS

机译:特殊设计的去离子分析物模拟样品的质谱法测定分析物的方法

摘要

A method for determining an amount of an analyte in a sample by mass spectrometry can include the steps of (i) ionizing an analyte from the sample and a deuterated analog of the analyte, to produce an analyte ion and a deuterated analog ion, where the deuterated analog undergoes fragmentation and deuterium scattering during mass spectrometry; (ii) measuring an analyte ion signal and a deuterated analog ion signal by mass spectrometry, where the deuterated analog ion signal is measured using a mass transition resulting from fragmentation and deuterium scattering; and (iii) determining an amount of analyte in the sample using the analyte ion signal and the deuterated analog ion signal. Corresponding kits can include instructions for carrying out the method, together with a deuterated analog of the analyte selected to undergo fragmentation and deuterium scattering during mass spectrometry and exhibit a mass transition resulting from fragmentation and deuterium scattering.
机译:一种用于通过质谱法确定样品中分析物含量的方法,可以包括以下步骤:(i)从样品和分析物的氘代类似物电离分析物,以产生分析物离子和氘代类似物离子,其中氘代类似物在质谱过程中发生碎片和氘散射; (ii)通过质谱法测量分析物离子信号和氘代模拟离子信号,其中所述氘代模拟离子信号是使用由碎片和氘散射产生的质量跃迁来测量的; (iii)使用分析物离子信号和氘代模拟离子信号确定样品中分析物的量。相应的试剂盒可包括用于执行该方法的说明,以及选择的分析物的氘代类似物,使其在质谱分析过程中发生碎片和氘散射,并表现出由碎片和氘散射引起的质量转变。

著录项

  • 公开/公告号EP2850435A1

    专利类型

  • 公开/公告日2015-03-25

    原文格式PDF

  • 申请/专利权人 MICROMASS UK LIMITED;

    申请/专利号EP20130725191

  • 发明设计人 EASTWOOD MARTIN;

    申请日2013-05-16

  • 分类号G01N33/68;G01N33/74;

  • 国家 EP

  • 入库时间 2022-08-21 15:03:14

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