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EVALUATING SUBSTRATE, ENVIRONMENTAL TEST DEVICE, AND EVALUATING METHOD OF TEST SPECIMEN

机译:评估基质,环境测试装置以及测试标本的评估方法

摘要

The present invention provides an evaluating substrate that is capable of accurately evaluating temperature characteristics of a test specimen because test temperature irregularities are unlikely to occur even in case a test specimen like a self-heating one is tested. According to the present invention, the test specimen (10) is evaluated by exposing the test specimen (10) to a desire temperature while the test specimen (10) is energized. The present invention includes a substrate main body (2) that has a wide surface shape; a mounting portion (3) on which the test specimen (10) can be mounted; and a heater (8) that heats the substrate main body (2). The mounting portion (3) is positioned on one circumferential surface of the substrate main body (2) and the heater (8) is distributed in the shape of a plane on the other circumferential surface of the substrate main body (2) and is integrated thereto.
机译:本发明提供了一种评估基板,该评估基板能够准确地评估测试样品的温度特性,因为即使在测试诸如自发热的测试样品的情况下也不太可能发生测试温度不规则性。根据本发明,通过在使试样(10)通电的同时使试样(10)暴露于期望温度来评价试样(10)。本发明包括具有宽的表面形状的基板主体(2);以及具有相对于基板主体(2)的基板主体。可以安装试样(10)的安装部分(3);加热器(8)对基板主体(2)进行加热。安装部(3)位于基板主体(2)的一个圆周面上,加热器(8)以平面形状分布在基板主体(2)的另一个圆周面上,并一体化。对此。

著录项

  • 公开/公告号KR20140138024A

    专利类型

  • 公开/公告日2014-12-03

    原文格式PDF

  • 申请/专利权人 ESPEC CORP.;

    申请/专利号KR20140049770

  • 发明设计人 TANAKA HIDEKI;

    申请日2014-04-25

  • 分类号G01N17;G01N25;G01R31/02;

  • 国家 KR

  • 入库时间 2022-08-21 15:01:29

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