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APPARATUS FOR PERFORMING A POWER LOSS TEST FOR A NON-VOLATILE MEMORY DEVICE AND METHOD OF PERFORMING A POWER LOSS TEST FOR A NON-VOLATILE MEMORY DEVICE
APPARATUS FOR PERFORMING A POWER LOSS TEST FOR A NON-VOLATILE MEMORY DEVICE AND METHOD OF PERFORMING A POWER LOSS TEST FOR A NON-VOLATILE MEMORY DEVICE
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机译:用于执行非易失性存储器的功率损耗测试的装置和用于执行非易失性存储器的功率损耗测试的方法
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摘要
A power loss test apparatus for a non-volatile memory device includes a test-board including at least one socket into which at least one test target non-volatile memory device is inserted, a micro controller that determines whether to supply power to the test target non-volatile memory device based on current consumption information or operating state information of the test target non-volatile memory device, and a tester that performs a power loss test for the test target non-volatile memory device based on whether the power is supplied to the test target non-volatile memory device.
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