METHOD AND APPARATUS FOR JOB PROFILING FOR HIGH THROUGHPUT COMPUTING

摘要

Disclosed is a method for enabling a work profile analysis device to analyze a work profile. The method comprises a step for calculating an influence index for each element related to an application and each element related to computing resources by analyzing a performed work profile and a step for selecting a first representative element having the biggest influence index among the elements related to the feature of the application and a second representative element having the biggest influence index among the elements related to the computing resources based on the calculation result.