首页> 外国专利> METHOD FOR AUTOMATICALLY SETTING INTELLIGENCE-TYPE DETERMINATION CRITERIA ACCORDING TO DESIGNATION OF REGIONS, AND X-RAY INSPECTION METHOD IN SMART LEARNING MANNER THEREBY

METHOD FOR AUTOMATICALLY SETTING INTELLIGENCE-TYPE DETERMINATION CRITERIA ACCORDING TO DESIGNATION OF REGIONS, AND X-RAY INSPECTION METHOD IN SMART LEARNING MANNER THEREBY

机译:根据区域的指定自动设置智能型确定标准的方法,以及智能学习方式的X射线检查方法

摘要

The present invention relates to a method for automatically setting intelligence-type determination criteria according to the designation of regions and an X-ray inspection method in a smart learning manner thereby and, more specifically, to a method for automatically setting intelligence-type determination criteria according to the designation of regions and an X-ray inspection method in a smart learning manner thereby, in which parameter values for normal and defective products are calculated in advance in an inspection early setting process by visual region designation to automatically determine a determination value and the determination value stored in the inspection process is applied. The method for automatically setting intelligence-type determination criteria according to the designation of regions, which is a method of setting a criteria reference value for X-ray inspection, the method comprising the steps of: calculating at least one parameter value selected in advance for at least one normal product and at least one defective product; and determining an inspection determination value on the basis of the calculated value.;COPYRIGHT KIPO 2015
机译:本发明涉及一种根据区域的指定自动设置智能类型确定标准的方法,以及一种以智能学习方式进行X射线检查的方法,尤其涉及一种自动设置智能类型确定标准的方法。根据区域的指定和以智能学习方式的X射线检查方法,其中在检查早期设置过程中,通过视觉区域指定预先计算出正常和次品的参数值,以自动确定确定值,应用检查过程中存储的确定值。根据区域的指定自动设置智能类型确定标准的方法,是一种设置用于X射线检查的标准参考值的方法,该方法包括以下步骤:计算至少一个预先选择的参数值以用于X射线检查。至少一种普通产品和至少一种次品;并根据计算值确定检查确定值。COPYRIGHTKIPO 2015

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