首页> 外国专利> HIGHLY SENSITIVE DETECTING METHOD OF MULTIPLE GENETIC MUTATIONS BASED ON NANO-PARTICLES USING KELVIN PROBE MICROSCOPE

HIGHLY SENSITIVE DETECTING METHOD OF MULTIPLE GENETIC MUTATIONS BASED ON NANO-PARTICLES USING KELVIN PROBE MICROSCOPE

机译:基于开尔文探针显微镜的纳米粒子多基因突变高灵敏度检测方法

摘要

The present invention relates to a highly sensitive detecting method of multiple genetic mutations based on nano-particles using a Kelvin probe microscope and, more specifically, to a method is to spread a complex which hybridizes a detecting DNA and the probe DNA after fixing a probe DNA on nano-particles on a substrate and detect whether a genetic mutation or not using surface potential measured by a Kelvin probe microscope at a nano-level.;COPYRIGHT KIPO 2015
机译:本发明涉及一种使用开尔文探针显微镜的基于纳米粒子的多种遗传突变的高灵敏度检测方法,更具体地,涉及一种在探针固定后将杂交检测DNA和探针DNA的复合物进行铺展的方法。底物上纳米颗粒上的DNA并使用开尔文探针显微镜在纳米水平上测量的表面电势检测是否存在基因突变。; COPYRIGHT KIPO 2015

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