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SPECTRAL REFLECTANCE FACTOR MEASUREMENT DEVICE FOR SMALL LENS

机译:小透镜的光谱反射系数测量装置

摘要

Disclosed is a spectral reflectance factor measurement device for a small lens. According to the present invention, the spectral reflectance factor measurement device for a small lens to measure a relative reflectance factor on a premeasured reference sample comprises: a light source (200); a collimate lens (202) to convert light emitted from the light source (200) to parallel light; a half mirror (210) to reflect the light emitted from the collimate lens (202); an objective lens (230) to collect the reflected light to a sample (220); and a spectroscope (240) to detect the light reflected from the sample (220). The spectral reflectance factor measurement device for a small lens comprises a central light removal lens (24) to remove a central light of the light emitted from the collimate lens (202). The central light removal lens comprises: a first axicon lens (244) having a flat incidence side (240) to receive the light emitted from the collimate lens (202) and a conical outlet side (242); and a second axicon lens (248) installed while a convex surface faces a convex surface of the first axicon lens (244) wherein a surface (246) relevant to a predetermined diameter from the center is a plane.;COPYRIGHT KIPO 2016
机译:公开了一种用于小透镜的光谱反射率因子测量装置。根据本发明,一种用于小透镜的光谱反射率测量装置,用于测量预先测量的参考样品上的相对反射率,包括:光源(200);准直透镜(202),将从光源(200)发出的光转换为平行光;半反射镜(210)反射从准直透镜(202)发射的光;物镜(230)将反射光收集到样品(220);分光镜(240)检测从样品(220)反射的光。用于小透镜的光谱反射率测量装置包括中心光去除透镜(24),以去除从准直透镜(202)发射的光的中心光。中央光去除透镜包括:第一轴锥透镜(244),其具有平坦的入射侧(240)以接收从准直透镜(202)发射的光和锥形出口侧(242); ;和第二轴锥透镜(248),其凸面面对第一轴锥透镜(244)的凸面,其中与从中心起的预定直径相关的表面(246)是平面。; COPYRIGHT KIPO 2016

著录项

  • 公开/公告号KR20150118072A

    专利类型

  • 公开/公告日2015-10-21

    原文格式PDF

  • 申请/专利权人 KANG TAE KYEONG;

    申请/专利号KR20150139162

  • 发明设计人 KANG TAE KYEONGKR;

    申请日2015-10-02

  • 分类号G01M11/02;G01J3/42;G01N21/55;

  • 国家 KR

  • 入库时间 2022-08-21 14:59:00

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