首页> 外国专利> Apparatus and method phase shifting stripe patterns projection for detecting defect of transparent object

Apparatus and method phase shifting stripe patterns projection for detecting defect of transparent object

机译:用于检测透明物体缺陷的相移条纹图案投影的装置和方法

摘要

The present invention provides a phase shift projection apparatus and method for detecting a defect in a transparent body and includes a projection unit that emits light of a grid image to a measurement unit to generate a dark field of the measurement object, (300); A measurement unit 200 for allowing the light emitted from the projection unit 300 to pass through the transparent object 210; The measurement unit 200 receives the light that has passed through the measurement object 210 by the light receiving optical system 120 and acquires an image from the camera 110. The Z map which is darkness darkness information extracted from the acquired image And an image acquiring unit (100) for performing defect detection of the measurement object (210) by using the projection optical system (200), thereby realizing a phase shift of repeated grating patterns and adjusting a projection magnification, So that all the light rays passing through the LCD can be incident along the optical axis of the light receiving unit to effectively inspect the light.
机译:本发明提供了一种用于检测透明体中的缺陷的相移投影设备和方法,并且包括:投影单元,其向测量单元发射栅格图像的光以产生测量对象的暗场;(300);测量单元200,用于使从投影单元300发射的光穿过透明物体210;测量单元200通过光接收光学系统120接收已经通过测量对象210的光,并且从照相机110获取图像。作为从获取的图像中提取的暗度信息的暗度信息的Z图和图像获取单元( 100),用于通过使用投影光学系统(200)对测量对象(210)进行缺陷检测,从而实现重复光栅图案的相移并调整投影倍率,从而可以使所有通过LCD的光线成为沿光接收单元的光轴入射以有效地检查光。

著录项

  • 公开/公告号KR101549310B1

    专利类型

  • 公开/公告日2015-09-01

    原文格式PDF

  • 申请/专利权人 이은석;

    申请/专利号KR20130155186

  • 发明设计人 이은석;

    申请日2013-12-13

  • 分类号G01N21/958;G01B11/25;

  • 国家 KR

  • 入库时间 2022-08-21 14:57:45

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