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METHOD TO MEASURE SERIES RESISTANCE OF CRYSTAL DIODE BASE

机译:一种测量晶体二极管基体串联电阻的方法

摘要

FIELD: electricity.;SUBSTANCE: invention uses the known method of series resistance measurement for diode base wherein direct current of different values is passed and voltage drop is measured at these values of direct current. The unknown value of diode base series resistance is defined by the known formulae. In order to achieve technical result direct current is set as three sequences of short rectangular pulses of high duty cycle and amplitude I1, kI1, 2kI1 and peak value of voltage U1, U2, U3 drop is measured at the diode when these current pulses are passed. Series resistance of the base is defined as per the formula <mrow><msub><mi>r</mi><mi>b</mi></msub><mo>=</mo><mfrac><mrow><mi>Δ</mi><msub><mi>U</mi><mrow><mn>32</mn></mrow></msub><mo>−</mo><mi>ν</mi><mi>Δ</mi><msub><mi>U</mi><mrow><mn>21</mn></mrow></msub></mrow><mrow><mrow><mo>[</mo><mrow><mi>k</mi><mo>−</mo><mi>ν</mi><mrow><mo>(</mo><mrow><mi>k</mi><mo>−</mo><mn>1</mn></mrow><mo>)</mo></mrow></mrow><mo>]</mo></mrow><msub><mi>I</mi><mn>1</mn></msub></mrow></mfrac><mtext> </mtext><mtext> </mtext><mtext>  (1)</mtext><mtext>,</mtext></mrow> where ΔU32=U3-U2; ΔU21=U2-U1; ν=ln 2/b; b=ln k.;EFFECT: improved accuracy of series resistance measurement at the diode base by exclusion of backheating of the diode p-n-transition by current passing in the process of measurement.;3 dwg
机译:技术领域本发明对二极管基极使用已知的串联电阻测量方法,其中使不同值的直流电通过,并且在这些直流电值下测量电压降。二极管基极串联电阻的未知值由已知公式定义。为了获得技术效果,将直流电设置为高占空比和幅值I 1 ,kI 1 ,2kI 1 的短矩形脉冲的三个序列。当这些电流脉冲通过时,在二极管处测量Sub>和电压U 1 ,U 2 ,U 3 的峰值。底座的串联电阻根据公式 <![CDATA [ r b = Δ U 32 ν Δ U 21 [ k ν < mrow> k 1 < / mrow> ] I 1 (1) ]]> <图像文件=“ 00000013。 GIF“ he =” 14“ imgContent =” undefined“ imgFormat =” GIF“ wi =” 57“ /> 其中ΔU 32 = U 3 -U 2 ; ΔU 21 = U 2 -U 1 ; ν= ln 2 / b; b = ln k .;效果:通过排除测量过程中电流通过对二极管的p-n过渡产生的回热,提高了二极管基极处串联电阻测量的准确性。; 3 dwg

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